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WDR81 is necessary for purkinje and photoreceptor cell survival

Journal of Neuroscience
2013

Traka, M.; Millen, K. J.; Collins, D.; Elbaz, B.; Kidd, G. J.; Gomez, C. M.; Popko, B.

Observation of the atomic structure of ß′-SiAlON using three generations of high resolution electron microscopes

Philosophical Magazine A
2013

Thorel, A.; Ciston, J.; Bartel, T.; Song. C. Y.; Dahmen, U.

Characterization of surface metallic states in SrTiO3 by means of aberration corrected electron microscopy

Ultramicroscopy
2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

Strong and ductile particulate reinforced ultrafine-grained metallic composites fabricated by flake powder metallurgy

Scripta Materialia
2013

Kai, X.; Zhiqiang Li, Z.; Genlian Fan, G.; Guo, Q.; Tan, Z.; Zhang, W.; Su, Y.; Weijie Lu, W.; Moon, W. J.; Zhang, D.

Large-scale automatic reconstruction of neuronal processes from electron microscopy images

Medical Image Analysis
2013

Kaynig, V.; Vazquez-Reina, A.; Knowles-Barley, S.; Roberts, M.; Jones, T. R.; Kasthuri, N.; Miller, E.; Lichtman, J.; Pfister, H.

New method for detection of Li inside He bubbles formed in B10-alloyed steel after neutron irradiation

Micron
2013

Klimenkov M.; Möslang A.; Materna-Morris, E.

An evaluation of FIB cross-sectioning using a cooling stage for metals and alloys with low melting point

Materials Science Forum
2013

Matsushima, H.; Suzuki, T.; Nokuo, T.

Construction and organization of a BSL-3 cryo-electron microscopy laboratory at UTMB

Journal of Structural Biology
2013

Sherman, M. B.; Trujillo, J.; Leahy, I.; Razmus, D.; DeHate, R.; Lorcheim, P.; Czarneskif, M. A.; Zimmerman, D.; Newton, J. T. M.; Haddow, A. D.; Weaver, S. C.

Elucidating elementary processes at Cu/ZnO interfaces: A microscopical approach

Physica Status Solidi
2013

Zychma, A.; Wansing, R.; Schott, V.; Köhler, U.; Wöll, C.; Muhler, M.; Birkner, A.

Direct quantification of ordering at a solid-liquid interface using aberration corrected transmission electron microscopy

Physical Review Letters
2013

Gandman, M.; Kauffmann, Y.; Koch, C. T.; Kaplan, W. D.

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