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CSV

Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage

Scientific Reports
2024

Chen, Y.; Chou, T. -C.; Fang, C. -H.; Lu, C. -Y.; Hsiao, C. -N.; Hsu, W. -T.; Chen, C. -C.

High-resolution single particle imaging at 100-200 keV with the Gatan Alpine direct electron detector

bioRxiv
2024

Chan, L. M.; Courteau, B. J.; Maker, A.; Wu, M.; Basanta, B.; Mehmood, H.; Bulkley, D.; Joyce, D.; Lee, B. C.; Mick, S.; Gulati, S.; Lander, G. C.; Verba, K. A.

Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

arXiv
2024

Mao, W.; Zhang, W.; Huang, C.; Zhou, L.; Kim, J. S.; Gao, S.; Lei, Y.; Wu, X.; Hu, Y.; Pei, X.; Fang, W.; Liu, X.; Song, J.; Fan, C.; Nie, Y.; Kirkland, A. I.; Wang, P.

Obtaining high-resolution cryo-EM structures using a common LaB6, 120-keV electron microscope equipped with a sub 200-keV optimised direct electron detector

bioRxiv
2024

Venugopal, H.; Mobbs, J.; Taveneau, C.; Fox, D. R.; Vuckovic, Z.; Knott, G.; Grinter, R.; Thal, D.; Mick, S.; Czarnik, C.; Ramm, G.

Strain effects in SrHfO3 films grown by hybrid molecular beam epitaxy

ACS Applied Electronic Materials
2025

Gemperline, P. T.; Thind, A. S.; Tang, C.; Sterbinsky, G. E.; Kiefer, B.; Jin, W.; Klie, R. F.; Comes, R. B.

Nondeterministic dynamics in the η-to-θ phase transition of alumina nanoparticles

Science
2025

Sakakibara, M.; Hanaya, M.; Nakamuro, T.; Nakamura, E.

Phenomenological understanding of the contribution of bulk and grain boundary precipitates on strengthening in prolonged-aged Al-Zn-Mg-Cu aluminium alloys

Materials Today Advances
2025

Tai, C. L.; Chiu, Y. N.; Chen, C. J.; Lin, S. K.; Lin, H. C.; Misra, R. D. K.; Yang, Y. L.; Hsiao, C. N.; Tsao, C. S.; Chung, T. F.

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