パブリケーション

31 - 40 of 1218 publications
CSV

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Characterization of surface metallic states in SrTiO3 by means of aberration corrected electron microscopy

Ultramicroscopy
2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy
2011

Dieterle, L.;Butz, B.; Müller, E.

In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy

Ultramicroscopy
2011

Crozier, P. A.; Chenna, S.

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Ultramicroscopy
2016

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso. A. J.; Allen, L. J.; Findlay, S. D.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

Ultramicroscopy
2009

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Optimising electronholography in the presence of partial coherence and instrument instabilities

Ultramicroscopy
2015

Chang, S. L.; Dwyer, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Pages