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Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ultramicroscopy
2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

Ultramicroscopy
2015

Tang, Y. L.; Zhu, Y. L.; Ma, X. L.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mølgaard, M. P.; Hansen, T. W.; Birkedal, W. J.; Degn, J. A.

Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy

Ultramicroscopy
2014

Forbes, B. D.; Houben, L.; Mayer, J.; Dunin-Borkowski, R. E.; Allen, L. J.

Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Ultramicroscopy
2017

Sinclair, R.; Lee, S. C.; Shi, Y.; Chueh, W. C.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Assessing and ameliorating the influence of the electron beam on carbon nanotube oxidation in environmental transmission electron microscopy

Ultramicroscopy
2017

Koh, A. L.; Sinclair, R.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy
2011

Dieterle, L.;Butz, B.; Müller, E.

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