M&M 2016 - Learning Sessions

Live Demonstrations

Reserve time to see how Gatan’s innovative specimen preparation equipment, advanced in-situ specimen holders and state-of-the-art high speed cameras help you push the boundaries of what can be done with electron microscopy. All demonstrations are in the Gatan booth (#702).

OneView® camera
ONE camera to capture high quality 16 megapixel still images AND video in all of your transmission electron microscope (TEM) applications.
  • Always have a “live” experience with 25 fps at full 4k x 4k resolution
  • Winner of the 2015 Microscopy Today Innovation Award
DENSsolutions in-situ TEM systems
Capture dynamic structural changes in situ to better understand the structure-property relationship for a full range of heating, biasing, gas, and liquid applications.
  • Leverage unrivaled sample stability to capture the real time dynamics of materials at elevated temperatures
  • Investigate nano-electronic materials and devices under a controllable electrical and thermal environment
  • Observe atomic gas-solid interactions in atmospheric pressure and high temperature environments
  • Image samples in fully-hydrated, static or flowing conditions


Lunch & Learn

Discover how products from Gatan bring you closer to your unique applications. All presentations are in the Gatan booth (#702). Space is limited and lunch will be available.

Monday, July 25
1:00 – 1:20 p.m. Low kV backscattered electron imaging with the OnPoint™ BSE detector
1:30 – 1:50 p.m. OneView: Redefining the TEM imaging experience
Tuesday, July 26
12:00 – 12:20 p.m. DENSsolutions MEMS-based in-situ holders
12:30 – 12:50 p.m. Gatan Microscopy Suite® (GMS) 3: Next generation software for analytical electron microscopy
Wednesday, July 27
12:30 – 12:50 p.m. Advances in cathodoluminescence in SEM and TEM



Learn how Gatan products deliver new approaches to advance your research. All presentations are in the Gatan booth (#702) from 5:45 – 6:45 p.m. each day. Please sign up at MSA megabooth (#914). Space is limited.

Monday, July 25
  • MEMS-based in-situ heating with a Gatan camera and GMS 3 integration
Tuesday, July 26
  • Application of Gatan high speed cameras for 4D data collection in STEM
  • Optimizing STEM spectrum image acquisition for high speed analysis
Wednesday, July 27
  • Introduction to DigitalMicrograph® scripting



We invite you to these Gatan authored/coauthored sessions on key EM applications and emerging technologies. Please check the scientific program for all final listings.

Monday, July 25
  • Application of high speed cameras for 4D data collection in S/TEM (A06.1, Room C224-25)
  • Simultaneous DualEELS and EDS analysis across the ohmic contact region in FinFET electronic devices – Exploring the effects of electron beam damage (A06.1, Room C224-25)
  • Performance of a direct electron detector for the application of electron energy loss spectroscopy (A06.P1, Exhibit Hall)
  • Design of a HAADF detector for Z contrast in SEM (A11.P1, Exhibit Hall)
Tuesday, July 26
  • Phase contrast imaging of weakly scattering samples with matched illumination and detector interferometry – scanning transmission electron microscopy (MIDI-STEM) (A09.1, Room C220)
  • iPrep – Automated serial-section broad ion beam tomography (A11.2, Room C121-22)
  • Multidimensional analysis of nanoscale phase separation in complex materials systems (A06.3, Room C224-25)
Wednesday, July 27
  • Operando electron microscopy of catalysts (A13.4, Room C221)