3View System

Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.

Advantages Research Spotlight Media Library Publications Resources Back to top

The 3View® system allows high-throughput, high-resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high-performance stages allow fully automated high-speed imaging of many different types of samples. 

  • Serial block-face imaging minimizes errors and distortions found when using focus ion beam imaging or traditional serial section imaging
  • Large format image support (32k x 24k) allows you to collect very large images to minimize the amount of time wasted waiting for stage motion when imaging very large regions
  • <50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion
  • 15 nm Z section thickness without the need to unblur multi-kV images
  • High-performance OnPoint™ backscattered electron (BSE) detector allows high-speed imaging at low kV, without giving up image quality


Molecular Cell

Booth, D. G.; Beckett, A. J.; Molina, O.; Samejima, I.; Masumoto, H.; Kouprina, N.; Larionov, V.; Prior, I. A.; Earnshaw, W. C.

Journal of Neuroscience

Holcomb, P. S.; Hoffpauir, B. K.; Hoyson, M. C.; Jackson, D. R.; Deerinck, T. J.; Marrs, G. S.; Dehoff, M.; Wu, J.; Ellisman, M. H.; Spirou, G. A.

Microscopy and Microanalysis

Dohnalkova, A.; Kennedy, D.; Mancuso, J.; Marshall, M.; Mainwaring, P.; Fredrickson, J.

Back to top