Extended x-ray absorption fine structure (EXAFS) at inner shell level is a well-established technique for probing short range structure and chemical ordering and possibly extended to medium range order, as well as other application for coordination environment. Its counterpart extended energy-loss fine structure (EXELFS) in the transmission electron microscopy (TEM) is much left behind due to several technical difficulties, including optics and detection and scattering noises, despite its clear strength at spatial resolution.