Multi-frame spectrum image (SI) summation has been proposed and successfully demonstrated as a means of improving both scanning transmission electron microscopy (STEM) spectrum image resolution and signal-to-noise ratio (SNR) [1]. Scintillator-based CMOS and CCD detectors are inadequate for multi-frame electron energy loss spectroscopy (EELS) SI at low-dose and high speeds due to the detrimental effects of read noise.