Publications

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy

2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Ultramicroscopy

2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

Ultramicroscopy

2014

Mortensen, P. M.; Hansen, T. W.; Wagner, J. B.; Jensen, A. D.

Ultramicroscopy

2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

Ultramicroscopy

2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

Ultramicroscopy

2015

Kohn, A.; Habibi, A.; Mayo, M.

Ultramicroscopy

2009

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Ultramicroscopy

2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Ultramicroscopy

2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Ultramicroscopy

2016

Chang, S. L. Y.; Dwyer, C.; Barthel, J.; Boothroyd, C. B.; Dunin-Borkowski, R. E.