
通过能量过滤和旋进辅助的 4D STEM 改进 Ge/SiGe 异质结构缺陷应变面分布
October 5, 2026
Element density: 3.12 g/cm3
Electron configuration: [Ar]3d104s24p5
Oxidation states: +1,5/-1

A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K‑Series | L‑Series | M‑Series | N‑Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 11.904 | Ll | 1.293 | ||||
| Kβ | 13.296 | Ln | 1.339 | ||||
| Lα1 | 1.480 | ||||||
| Lβ1 | 1.526 | ||||||
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