应用说明
突破EDS局限性：利用WDS进行硅片污染物检测
April 15, 2025
Tungsten
Element density: 19.25 g/cm3
Electron configuration: [Xe]4f145d46s2
Oxidation states: +6
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 59.305 | Ll | 7.385 | Mz | 1.383 | N | 0.215 |
| Kβ | 67.372 | Ln | 8.722 | Mα | 1.774 | ||
| Lα1 | 8.394 | Mβ | 1.835 | ||||
| Lβ1 | 9.669 | Mγ | 2.035 | ||||
| Lβ2 | 9.957 | M2N4 | 2.314 | ||||
| Lγ1 | 11.282 | ||||||
| Lγ2 | 11.605 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
应用说明
Virtual (BF/DF) imaging reveals the position and concentration of precipitates in a Ni-W alloy
July 1, 2024
应用说明
Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages
April 2, 2024
应用说明
从 EDS 到 WDS 带来的提升
January 24, 2024
应用说明
GIF Continuum 实现纳米电子材料的高速组分和化学分析
January 1, 2024
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
