Fast STEM spectrum imaging using simultaneous EELS and EDS in DigitalMicrograph software

Up to now, researchers performing analytical investigations in the transmission electron microscope typically had to choose between analytical spectroscopy techniques. They might choose energy dispersive x-ray spectroscopy (EDS) analysis when working with thick samples containing high-Z elements, or choose electron energy loss spectroscopy (EELS) when studying low-Z species in thin samples.