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半導体デバイス上の炭化水素堆積物の除去半導体デバイス上の炭化水素堆積物の除去
試料表面のダメージを最小化しシリコンの試料状態を維持試料表面のダメージを最小化しシリコンの試料状態を維持
In-situ Diffraction studies with the Rio 16In-situ Diffraction studies with the Rio 16
Live, full FOV Au sinteringLive, full FOV Au sintering
Observing sample dynamics using in-situ EELS and heating webinarObserving sample dynamics using in-situ EELS and heating webinar
Artifact-free diffraction rings Artifact-free diffraction rings
Choose the right FOV for your application Choose the right FOV for your application
Live drift correction and full resolution image display on the Rio camera Live drift correction and full resolution image display on the Rio camera
High-resolution image of C. elegans stomach sample High-resolution image of C. elegans stomach sample
Easily manage a large list of tasksEasily manage a large list of tasks
Simplify repetitive single-particle screening tasksSimplify repetitive single-particle screening tasks
Use templates to mark many good areasUse templates to mark many good areas
Quickly preview different sample areasQuickly preview different sample areas
Single-particle screening made simpleSingle-particle screening made simple
4D STEM operating principle4D STEM operating principle
2D diffraction pattern for each real space STEM pixel2D diffraction pattern for each real space STEM pixel
Study grain orientations with virtual aperturesStudy grain orientations with virtual apertures
In-Situ Explorerを使用したMoSx基の試料の取得データIn-Situ Explorerを使用したMoSx基の試料の取得データ

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