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1 - 18 of 241 media results
High-resolution EELS on high entropy perovskite oxide thin filmsHigh-resolution EELS on high entropy perovskite oxide thin films
Off the grid: Advanced scanning strategies for modern STEMOff the grid: Advanced scanning strategies for modern STEM
High electron energy loss spectroscopy at extended fine structureHigh electron energy loss spectroscopy at extended fine structure
Ni nanoplatelet sample fabricated by Felipe Quiroga-Suavita (LPCNO - INSA Toulouse and SMS - UNSW Sydney, EU MSCA-AUFRANDE)在 DigitalMicrograph 中通过 STEMx OIM 获取 4D STEM 取向分布
消除背景噪声,增强细节信息:Metro 电子计数相机在 SAED 和 4D STEM 中的应用消除背景噪声,增强细节信息:Metro 电子计数相机在 SAED 和 4D STEM 中的应用
实时原位洞察:使用 4D STEM 进行动态 mappingReal-time in-situ insights: Dynamic mapping with 4D STEM
少即是多 – 通过电子计数 EELS 减少样品辐照剂量、损伤和表征时间少即是多 – 通过电子计数 EELS 减少样品辐照剂量、损伤和表征时间
Dose-fractionated EELS spectrum image acquisition使用直接探测相机进行剂量分割的 EELS 谱成像采集
Orientation map generated with STEMx OIM Orientation map generated with STEMx OIM
Gatan eaSI 技术实现剂量高效的 EELS 谱像采集Gatan eaSI 技术实现剂量高效的 EELS 谱像采集
GIF Continuum K3 IS: Advanced Direct Detection for In-Situ Chemical AnalysisGIF Continuum K3 IS: Advanced Direct Detection for In-Situ Chemical Analysis
Continuously acquired 4D STEM and EELS spectrum images for in-situ microscopy webinarContinuously acquired 4D STEM and EELS spectrum images for in-situ microscopy webinar
Auf den Spuren von Lithium im MikrometerbereichAuf den Spuren von Lithium im Mikrometerbereich
4D STEM and Virtual Aperture Imaging with ClearView 4D STEM and Virtual Aperture Imaging with ClearView
Image samples at the desired orientation with TruAlign Image samples at the desired orientation with TruAlign
Better resolve faint, high-resolution diffraction spots with ClearView Frame Control mode Better resolve faint, high-resolution diffraction spots with ClearView Frame Control mode
High signal-to-noise TEM imaging with ClearView Frame Control mode High signal-to-noise TEM imaging with ClearView Frame Control mode
Live drift correction during imaging acquisition Live drift correction during imaging acquisition

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