出版物

31 - 40 of 1218 publications
CSV

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Ultramicroscopy
2016

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso. A. J.; Allen, L. J.; Findlay, S. D.

Performance of a direct detection camera for off-axis electron holography

Ultramicroscopy
2016

Chang, S. L. Y.; Dwyer, C.; Barthel, J.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy
2010

Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy
2011

Dieterle, L.;Butz, B.; Müller, E.

On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

Ultramicroscopy
2015

Tang, Y. L.; Zhu, Y. L.; Ma, X. L.

Seeing the atoms more clearly: STEM imaging from the Crewe era to today

Ultramicroscopy
2012

Pennycook, S. J.

In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy

Ultramicroscopy
2011

Crozier, P. A.; Chenna, S.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

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