出版物

31 - 40 of 1218 publications
CSV

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy

Ultramicroscopy
2014

Forbes, B. D.; Houben, L.; Mayer, J.; Dunin-Borkowski, R. E.; Allen, L. J.

Experimental evaluation of the ′transport-of-intensity′ equation for magnetic phase reconstruction in Lorentz transmission electron microscopy

Ultramicroscopy
2015

Kohn, A.; Habibi, A.; Mayo, M.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

Performance of a direct detection camera for off-axis electron holography

Ultramicroscopy
2016

Chang, S. L. Y.; Dwyer, C.; Barthel, J.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Low-dose (S)TEM elemental analysis of water and oxygen uptake in beam sensitive materials

Ultramicroscopy
2019

Leijten, Z. J. W. A.; Wirix, J. M.; Strauss, M.; Plitzko, J. M.; de With, G.; Friedrich, H.

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Ultramicroscopy
2017

Pekin, T. C.; Gammer, C.; Ciston. J.; Minor, A. M.; Ophus, C.

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