Crystallographic and strain mapping in beam-sensitive halide perovskite thin films

Halide perovskites are some of the most exciting emerging materials for next-generation solar cells due to their very high efficiency and simple solution processing. However, their relatively poor stability under the electron beam has led to difficulties in mapping their crystallographic orientation, grain size distribution, and local strain. In this webinar, we will describe the advantages of the very high sensitivity of the Clarity EBSD Analysis System for beam-sensitive materials, such as halide perovskite thin films.