31 - 40 of 1218 publications
Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)
Ultramicroscopy
2020
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
Ultramicroscopy
2017
Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
Ultramicroscopy
2013
On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns
Ultramicroscopy
2015
In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy
Ultramicroscopy
2011