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CSV

Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy

Ultramicroscopy
2014

Forbes, B. D.; Houben, L.; Mayer, J.; Dunin-Borkowski, R. E.; Allen, L. J.

Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

Ultramicroscopy
2009

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Mechanical response of gasoline soot nanoparticles under compression: An in situ TEM study

Tribology International
2019

Jenei, I. Z.; Dassenoy, F.; Epicier, T.; Khajeh, A.; Martinic, A.; Uy, D.; Ghaednia, H.; Gangopadhyay, A.

Multi-scale study of initial tool wear on textured alumina coating, and the effect of inclusions in low alloyed steel

Tribology International
2016

Bejjani, R.; Collin, M.; Thersleff, T.; Odelros, S.

Direct observation of the crystal structure changes in the MgxZn1 − xO alloy system

Thin Solid Films
2015

Yoo, S. J.; Lee, J. -H.; Kim, C. -Y.; Kim, J. -G.

Abnormalities associated with grain growth in solid solution Cu(Ni) thin films

Thin Solid Films
2014

Brons, J. G.; Thompson, G. B.

The hardness and related deformation mechanisms in nanoscale crystalline–amorphous multilayers

Thin Solid Films
2015

Cui, Y.; Huang, P.; Wang, F.; Lu, T. J.; Xu, K. W.

Effect of wavelength modulation of arc evaporated Ti–Al–N/Ti–Al–V–N multilayer coatings on microstructure and mechanical/tribological properties

Thin Solid Films
2014

Pfeiler-Deutschmann, M.; Mayrhofer, P. H.; Chladil, K.; Penoy, M.; Michotte, C.; Kathrein, M.; Mitterer, C.

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