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Optimization of mechanical and corrosion properties of plasma sprayed low-chromium containing Fe-based amorphous/nanocrystalline composite coating

Surface and Coatings Technology

2019

Kumar, A.; Nayak, S. K.; Bijalwan, P.; Dutta, M.; Banerjee, A.; Laha, T.

Effect of supersonic fine particle bombardment on microstructure and fatigue properties of Ti-6.5 Al-3.5 Mo-1.5 Zr-0.3 Si titanium alloy at different temperatures

Surface and Coatings Technology

2021

Wu, Y.; Xiong, Y.; Liu, W.; Chen, Z.; Zhang, X.; Wang, S.; Cao, W.

Cryo-EM structure of the human NKCC1 transporter reveals mechanisms of ion coupling and specificity

The EMBO Journal

2022

Neumann, C.; Rosenbæk, L. L.; Flygaard, R. K.; Habeck, M.; Karlsen, J. L.; Wang, Y.; Larsen, K. L.; Gad, H. H.; Hartmann, R.; Lyons, J. A; Fenton, R. A.; Nissen, P.

Mechanical response of gasoline soot nanoparticles under compression: An in situ TEM study

Tribology International

2019

Jenei, I. Z.; Dassenoy, F.; Epicier, T.; Khajeh, A.; Martinic, A.; Uy, D.; Ghaednia, H.; Gangopadhyay, A.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy

2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy

2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ultramicroscopy

2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy

2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy

2020

Addiego, C.; Gao, W.; Pan, X.

Low-dose (S)TEM elemental analysis of water and oxygen uptake in beam sensitive materials

Ultramicroscopy

2019

Leijten, Z. J. W. A.; Wirix, J. M.; Strauss, M.; Plitzko, J. M.; de With, G.; Friedrich, H.

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