パブリケーション

11 - 20 of 1218 publications
CSV

Deagglomeration of DNA nanomedicine carriers using controlled ultrasonication

Ultrasonics Sonochemistry
2022

Hinchliffe, B. A.; Turner, P.; J. H. Cant, D.; De Santis, E.; Aggarwal, P.; Harris, R.; Templeton, D.; Shard, A. G.; Hodnett, M.; Minelli, C.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Characterization of surface metallic states in SrTiO3 by means of aberration corrected electron microscopy

Ultramicroscopy
2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mølgaard, M. P.; Hansen, T. W.; Birkedal, W. J.; Degn, J. A.

Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography

Ultramicroscopy
2009

Jarausch, K.; Thomas, P.; Leonard, D. N.; Twesten, R.; Booth, C. R.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

Pages