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31 - 40 of 1218 publications
CSV

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy
2011

de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.

Assessing and ameliorating the influence of the electron beam on carbon nanotube oxidation in environmental transmission electron microscopy

Ultramicroscopy
2017

Koh, A. L.; Sinclair, R.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mortensen, P. M.; Hansen, T. W.; Wagner, J. B.; Jensen, A. D.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Characterization of surface metallic states in SrTiO3 by means of aberration corrected electron microscopy

Ultramicroscopy
2013

Sánchez-Santolino, G.; Tornos, J.; Bruno, F. Y.; Cuellar, F. A.; Leon, C.; Santamaría, J.; Pennycook, S. J.; Varela, M.

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