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Deagglomeration of DNA nanomedicine carriers using controlled ultrasonication

Ultrasonics Sonochemistry
2022

Hinchliffe, B. A.; Turner, P.; J. H. Cant, D.; De Santis, E.; Aggarwal, P.; Harris, R.; Templeton, D.; Shard, A. G.; Hodnett, M.; Minelli, C.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy
2011

de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

Ultramicroscopy
2017

Pekin, T. C.; Gammer, C.; Ciston. J.; Minor, A. M.; Ophus, C.

In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy

Ultramicroscopy
2011

Crozier, P. A.; Chenna, S.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

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