パブリケーション

21 - 30 of 1218 publications
CSV

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy
2011

de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.

Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Ultramicroscopy
2017

Sinclair, R.; Lee, S. C.; Shi, Y.; Chueh, W. C.

Assessing and ameliorating the influence of the electron beam on carbon nanotube oxidation in environmental transmission electron microscopy

Ultramicroscopy
2017

Koh, A. L.; Sinclair, R.

Precise measurement of the electron beam current in a TEM

Ultramicroscopy
2021

Krause, F. F.; Schowalter, M.; Oppermann, O.; Marquardt, D.; Müller-Caspary, K.; Ritz, R.; Simson, M.; Ryll, H.; Huth, M.; Soltau, H.; Rosenauer, A.

Coupled broad ion beam-scanning electron microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

Ultramicroscopy
2020

Gholinia, A.; Curd, M. E.; Bousser, E.; Taylor, K.; Hosman, T.; Coyle, S.; Hassel Shearer, M.; Hunt, J.; Withers, P. J.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mortensen, P. M.; Hansen, T. W.; Wagner, J. B.; Jensen, A. D.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

Pages