Experience the next level of micro-XRF analysis with the EDAX Orbis II

Micro-XRF is a powerful technique for non-destructive elemental analysis and mapping, and recent advances in instrument design continue to expand its capabilities. In this webinar, discover how the EDAX^® Orbis II micro-XRF system combines its patented perpendicular x-ray geometry with enhanced light element detection and quantification, improved sensitivity, and exceptional analytical precision to address a wide range of analytical challenges.

Through real-world examples, we will demonstrate how Orbis II delivers precise compositional analysis, high-quality elemental mapping, and outstanding performance across applications involving major, minor, trace, and light elements. Attendees will also learn how the speed, versatility, and non-destructive nature of micro-XRF enable efficient workflows across diverse applications.