Application Note
How to correlate micro-XRF and SEM-EDS for optimal x-ray characterization of materials
September 29, 2023
EDAX Orbis II Micro-XRF System
Model 1140
Delivers non-destructive, high-performance elemental analysis with unmatched flexibility and ease of use.
Advantages
The EDAX® Orbis™ II micro-x-ray fluorescence (micro-XRF) system delivers non-destructive, high-performance elemental analysis with unmatched flexibility and ease of use. Engineered for excellence across the full spectrum of micro-XRF applications, the Orbis II empowers users to analyze everything from the smallest particles to large, complex samples—quickly and accurately. Experience the next level of micro-XRF analysis with the EDAX Orbis II—where precision meets performance.
Custom x-ray window technology enables the detection of light elements
Proprietary coaxial light and x-ray optics precisely targets specific regions – eliminating x-ray interference from adjacent areas
Maximizes throughput by collecting spectra 2.5x faster and spectral maps >3x faster
Streamlines workflows with programmable autorun routines to boost productivity and ensure consistent results
Datasheet
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
Application Note
Non-destructive authentication of gemstones using micro-XRF
November 10, 2021
Application Note
Precision forensic glass analysis using the EDAX Orbis II micro-XRF system
August 20, 2020
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
The Orbis II leverages a patented orbital turret to seamlessly align the x-ray optical axis with the high-magnification view of your sample.
This 15 mm x 15 mm floor tile was scanned using a 50 kV tube voltage and 1,000 μA tube current. A 30 μm polycapillary optic enabled high resolution mapping at a 15 μm step size and 200 ms pixel time.
A graph showing the transmissions curves for the two different window options for the EDAX Orbis II. The beryllium window (red) shows higher transmission at higher x-ray energies, while the silicon nitride window (green) performs better at lower x-ray energies.
Resources
Explore tools, data, and insights powering electron microscopy—from applications and periodic table resources to expert blogs and newsletters.
EM Academy
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FAQs
Find quick answers to common electron microscopy questions with our comprehensive FAQs
Service Plans
Preventive maintenance, upgrades, service adjustments and repairs to assure your Gatan products are operating at peak performance
Blog
Discover cutting-edge insights, expert perspectives, and practical applications in electron microscopy
