アプリケーション
In-situ 4D STEM を用いて観察を行ったランダムな方位への結晶化
November 1, 2024
Tin
Element density: 7.31 g/cm3
Electron configuration: [Kr]4d105s25p2
Oxidation states: +2,4
X-ray peak intensities
A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.
| K-Series | L-Series | M-Series | N-Series | ||||
|---|---|---|---|---|---|---|---|
| Kα | 25.268 | Ll | 3.043 | Mz | 0.398 | ||
| Kβ | 28.554 | Ln | 3.271 | Mγ | 0.691 | ||
| Lα1 | 3.442 | ||||||
| Lβ1 | 3.661 | ||||||
| Lβ2 | 3.903 | ||||||
| Lγ1 | 4.129 | ||||||
| Lγ2 | 4.375 | ||||||
Applications
Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.
アプリケーション
Mapping the electronic band gap of semiconductor compounds with milli-electron volt accuracy
December 1, 2023
アプリケーション
良好なEBSD測定を可能とする多相アルミニウム合金表面の最適化
May 1, 2023
アプリケーション
マイクロLED製造工程における検査、測長、故障解析のためのカソードルミネッセンス
November 12, 2020
Media Gallery
Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.
