Tungsten

Element density: 19.25 g/cm³

Electron configuration: [Xe]4f¹⁴5d⁴6s²

Oxidation states: +6

X-ray peak intensities

A quick-reference for exploring x-ray peak intensities across element series (K, L, M, N) to support accurate EDS analysis in electron microscopy.

Periodic Table

K-Series		L-Series		M-Series		N-Series
Kα	59.305	Ll	7.385	Mz	1.383	N	0.215
Kβ	67.372	Ln	8.722	Mα	1.774
		Lα¹	8.394	Mβ	1.835
		Lβ¹	9.669	Mγ	2.035
		Lβ²	9.957	M²N⁴	2.314
		Lγ¹	11.282
		Lγ²	11.605

Periodic Table

Applications

Unlock the power of electron microscopy with Gatan—explore cutting-edge applications, dive into expert-led webinars, and discover insights through detailed application notes that fuel scientific breakthroughs.

Reveal EM Insights

Breaking through EDS limitations: A study on using WDS for silicon wafer contaminant detection

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EDSの限界を打ち破る：シリコンウェハーの汚染物質検出にWDSを使用する研究

April 15, 2025

Virtual (BF/DF) imaging reveals the position and concentration of precipitates in a Ni-W alloy

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Ni-W合金中析出物の分布と濃度を明らかにする仮想 (BF/DF) 像観察

July 1, 2024

Use of a large area windowless EDS detector for quantitative analysis of heavy elements at high accelerating voltages

アプリケーション

大面積ウィンドウレスEDS検出器を用いた高加速電圧下での重元素定量分析

April 2, 2024

アプリケーション

EDSからWDSへの拡張機能

January 24, 2024

High-speed composition and chemical analysis of nanoelectronic materials with GIF Continuum

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GIF Continuumを用いたナノエレクトロニクス材料に対する高速組成分析と高速化学分析

January 1, 2024

Reveal EM Insights

Media Gallery

Immerse yourself in the world of scientific discovery—explore striking microscopy images that reveal the unseen, alongside videos and tutorials showcasing Gatan technology in action.

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