GMS 3.4 原位数据处理 : 原位数据处理介绍

Gatan Microscopy Suite (GMS) 3.4 软件处理原位数据的系列教程的第一个视频,向您演示如何使用 IS Player 打开原位数据集,并展示了数据集的文件结构。

Strain mapping

Here, we show how you can calculate specimen strain from a 4D STEM nanobeam diffraction dataset in the DigitalMicrograph software.

DIFPack Tools

Here we show how you can use DIFPack tools to analyze 2D diffraction patterns and 4D STEM diffraction data cubes.

Diffraction Alignment

Here we show how to remove de-scan artifact from 4D STEM data cube post acquisition.

Volume tools

Here we show how you can use the volume tools in DigitalMicrograph to process STEMx 4D STEM datasets.

利用 K3 IS 相机实现低剂量/高速原位 TEM 表征

K3 IS 直接探测相机用途广泛,在对材料反应的原位表征中能够轻松无障碍的在低剂量和高速成像之间切换。K3 IS 相机的大视野能够在诸如环境电镜中特定温度下对纳米颗粒的相变研究,电池阳极的锂化过程,以及在原位表征过后对纳米线运用 4D STEM 进行应变分布等应用中带来优势。此外,低剂量表征能够与针对包括电池电极/电解液、金属有机框架结构等在内的电子束敏感材料的冷冻成像技术互相结合。电子束敏感环境成像能够充分利用 K3 IS 这一先进相机的实时帧平均功能,在采集外场刺激施加前浏览样品,同时相机的“回看”功能能够防止关键图像的丢失。本次网络研讨会将通过一系列的材料体系和反应,凸显 K3 IS 相机的原位和低剂量成像功能及其广泛用途和易用界面。

我们的工作集中在原位研究上,细节将着重讨论快速反应和电子束敏感材料。

主讲人

Katherine Jungjohann, Ph.D., Center for Integrated Nanotechnologies, Sandia National Laboratories

John Watt, Ph.D., Center for Integrated Nanotechnologies, Los Alamos National Laboratory

Virtual Bright- and Dark-Field

Here we review how to map the variation in signal intensity of a feature(s) in the diffraction domain using STEMx 4D STEM.

Virtual Selected Area Diffraction

Here we produce virtual selected area electron diffraction (SAED) patterns using STEMx 4D STEM.

Live Oxidation State Mapping and In-Situ Heating

We demonstrate how to set up and run a STEM EELS in-situ heating experiment on the GIF Continuum system.

GIF Continuum: Multisignal Spectrum Imaging Part 3 of 3

During this three-part tutorial, we demonstrate how to set up and run a multisignal STEM spectrum imaging experiment on the GIF Continuum system. Part three demonstrates how to set up and acquire a 4D STEM and EDS spectrum image dataset.

Pages