SEM 产品

Octane Elite SDD 的进展将探测器技术提升至一个全新高度。此系列探测器采用了新型氮化硅 (Si3N4) 窗口，使轻元素检测和低 kV 微区分析中的低能段灵敏度有了显著改善。

An enhanced energy dispersive spectroscopy (EDS) platform with the latest silicon drift detector (SDD) technology and high-speed electronics advancements.

Delivers powerful energy dispersive spectroscopy (EDS) analytical capability in a compact package, maximizing performance and flexibility while providing streamlined operation to guarantee fast results and ease of use.

The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV.

Offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials.

重新定义SEM上阴极荧光的表征能力。

为您的扫描电子显微镜带来彩色阴极发光成像功能。

Combines the EDAX wavelength dispersive spectrometry (WDS) analysis software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.

Cipher^® – The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes

A world-class materials characterization solution that provides users with elemental composition and crystallographic orientation results in one easy-to-use package.

By integrating energy dispersive spectroscopy (EDS) and wavelength dispersive spectrometry (WDS) analytical techniques on a single platform, EDAX Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS.

Combines the latest advances in energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectrometry (WDS) in a single analytical tool.

利用数字化的电子束控制和图像处理来提高数字成像系统的质量。

一款适用于 SEM 的高速低电压成像背散射电子探测器。

利用宽幅氩离子束对样品进行抛光和镀膜处理，从而得到高质量的SEM 成像和分析结果。

新一代等离子清洗设备，去除TEM与SEM样品以及样品杆的碳氢化合物污染。

采用低加速电压抛光制备无损的 SEM 截面样品。

采用液氦和液氮样品台来开展低温或温度相关研究，从而更好地了解您的电气和电子材料样品 。

专为原位研究设计的加热样品台

Premier software program for collecting and analyzing energy dispersive spectroscopy (EDS) data and the compositional characterization of materials.

Enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform.

The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data.

Combines the intuitive workflow of the APEX software platform with the analytical power of wavelength dispersive spectrometry (WDS) to provide the ultimate resolution and trace element analysis to users of all levels.

The industry standard software for electron microscope experimental control and analysis.