Better understand material complexities and failures to shrink geometries, industrialize novel 3D architectures and to improve device performance.
Read more...
Be confident you can reproducibly prepare then measure structural changes in soft materials that induce stresses and strain within transition metals, affect electronic conductivities, and lead to irreversible phase transformations that decrease your product’s energy output.
Read more...
Han, L.; Addiego, C.; Prokhorenko, S.; Wang, M.; Fu, H.; Nahas, Y.; Yan, X.; Cai, S.; Wei, T.; Fang, Y.; Liu, H.; Ji, D.; Guo, W.; Gu, Z.; Yang, Y.; Wang, P.; Bellaiche, L.; Chen, Y.; Wu, D.; Nie, Y.; Pan, X.
Kim, S. C.; Huang, W.; Zhang, Z.; Wang, J.; Kim, Y.; Jeong, Y. K.; Oyakhire, S. T.; Yang, Y.; Cui, Y.
Kim, M. S.; Zhang, Z.; Rudnicki, P. E.; Yu, Z.; Wang, J.; Wang, H.; Oyakhire, S. T.; Chen, Y.; Kim, S. C.; Zhang, W.; Boyle, D. T.; Kong, X.; Xu, R.; Huang, Z.; Huang, W.; Bent, S. F.; Wang, L. -W.; Qin, J.; Bao, Z.; Cui , Y.
Yu, Z.; Rudnicki, P. E.; Zhang, Z.; Huang, Z.; Celik, H.; Oyakhire, S. T.; Chen, Y.; Kong, X.; Kim, S. C.; Xiao, X.; Wang, H.; Zheng, Y.; Kamat, G. A.; Kim, M. S.; Bent, S. F.; Qin, J.; Cui, Y.; Bao, Z.
Zhang, Z.; Li, Y.; Xu, R.; Zhou, W.; Li, Y.; Oyakhire, S. T.; Wu, Y.; Xu, J.; Wang, H.; Yu, Z.; Boyle, D. T.; Huang, W.; Ye, Y.; Chen, H.; Wan, J.; Bao, Z.; Chiu, W.; Cui, Y.
Sharangi, P.; Pandey, E.; Mohanty,S.; Nayak, S.; Bedanta, S.
Zaccagnini, P.; Ballin, C.; Fontana, M.; Parmeggiani, M.; Bianco, S.; Stassi, S.; Pedico, A.; Ferrero, S.; Lamberti, A.
Liting Yang, L.; Li, X.; Pei, K.; You, W.; Liu, X.; Xia, H.; Wang, Y.; Che, R.
Behera, P.; May, M. A.; Gómez-Ortiz, F.; Susarla, S.; Das, S.; Nelson, C. T.; Caretta, L.; Hsu, S. -L.; McCarter, M. R., Savitzky, B. H.; Barnard, E. S.; Raja, A.; Hong, Z.; García-Fernandez, P.; Lovesey, S. W.; van der Laan, G.; Ophus, C.; Martin, L. W.; Junquera, J.; Raschke, M. A.; Ramesh, R.
Giusto, P.; Cruz, D.; Heil, T.; Tarakina, N.; Patrini, M.; Antonietti, M.
Murthy, A. A.; Stanev, T. K.; Ribet, S. M.; Liu, P.; Watanabe, K.; Taniguchi, T.; Stern, N. P.; dos Reis, R.; Dravid, V. P.
Balch, H. B., Evans, A. M., Dasari, R. R., Li, H., Li, R., Thomas, S., Wang, Q., Bisbey, R. P., Slicker, K., Castano, I., Xun, S., Jiang, L., Zhu, C., Gianneschi, N., Ralph, D. C., Brédas, J-L., Marder, S. R., Dichtel, W. R., Wang, F.
Zhang, Z.; Yang, J.; Huang, W.; Wang, H.; Zhou, W.; Li, Y.; Li, Y.; Xu, J.; Huang, W.; Chiu, W.
Li, H. -K.; de Souza, J. P.; Zhang, Z.; Martis, J.; Sendgikoski, K.; Cumings, J.; Bazant, M. Z.; Majumdar, A.
Fang, C.; Li, J.; Zhang, M.; Zhang, Y.; Yang, F.; Lee, J. Z.; Lee, L. M. -H.; Alvarado, J.; Schroeder, M. A.; Yang, Y.; Lu, B.; Williams, N.; Ceja, M.; Yang, L.; Cai, M.; Gu, J.; Xu, K.; Wang, X.; Meng, Y. S.
Pan, J.; Chen, S.; Fu, Q.; Sun, Y.; Zhang, Y.; Lin, N.; Gao, P.; Yang, J.; Qian, Y.
Pan, J.; Chen, S.; Zhang, D.; Xu, X.; Sun, Y.; Tian, F.; Gao, P.; Yang, J.
Yasin, F. S.; Harvey, T. R.; Chess, J. J.; Pierce, J. S.; Ophus, C.; Ercius, P.; McMorran, B. J.
Gammer, C.; Ophus, C.; Pekin, T. C.; Eckert, J.; Minor, A. M.
Shi, L.; Pang, C.; Chen, S.; Wang, M.; Wang, K.; Tan, Z.; Gao, P.; Ren, J.; Huang. Y.; Peng, H.; Liu, Z.
Wegele, T.; Beyer, A.; Ludewig, P.; Rosenow, P.; Duschek, L.; Jandieri, K.; Tonner, R.; Stolz, W.; Volz, K.
DigitalMicrograph,或称为 Gatan Microscopy Suite,驱动您的电子相机和其他附件以支持一系列重要应用,包括断层扫描、原位、谱学和衍射成像等。
Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties
Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties
EDAX Octane Elite SDD 的进展将探测器技术提升至一个全新高度。此系列探测器采用了新型氮化硅 (Si3N4) 窗口,使轻元素检测和低 kV 微区分析中的低能段灵敏度有了显著改善。
An enhanced energy dispersive spectroscopy (EDS) platform with the latest silicon drift detector (SDD) technology and high-speed electronics advancements.
Delivers powerful energy dispersive spectroscopy (EDS) analytical capability in a compact package, maximizing performance and flexibility while providing streamlined operation to guarantee fast results and ease of use.
Offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials.
The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV.
Combines the EDAX wavelength dispersive spectrometry (WDS) analysis software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.
Combines the latest advances in energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectrometry (WDS) in a single analytical tool.
A world-class materials characterization solution that provides users with elemental composition and crystallographic orientation results in one easy-to-use package.
By integrating energy dispersive spectroscopy (EDS) and wavelength dispersive spectrometry (WDS) analytical techniques on a single platform, EDAX Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS.
Premier software program for collecting and analyzing energy dispersive spectroscopy (EDS) data and the compositional characterization of materials.
Enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform.
The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data.
The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes