出版物

81 - 90 of 910 publications

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied Physics Letters
2015

Ozdol, V. B.; Gammer,C.; Jin, X. G.; Ercius, P.; Ophus, C.; Ciston,J.; Minor, A. M.

Visualization of hybridization states with atomic resolution using electron energy loss spectroscopy mapping

Applied Physics Letters
2012

Haruta, M.; Kurashima, K.; Nagai, T.; Komatsu, H.; Shimakawa, Y.; Kurata, H.; Kimoto, K.

Investigation of deformations and strain fields in silicon matrix structures embedded with vertically stacked Ge(Si) self-assembled islands

Applied Physics Letters
2014

Pavlov, D. A.; Bobrov, A. I.; Novikov, A. V.; Sorokin, D. S.; Malekhonova, N. V.; Pirogov, A. V.; Nikolitchev, D. E.; Boryakov, A. V.

Water-induced nanochannel networks in self-assembled block ionomers

Applied Physics Letters
2016

Mineart, K. P.; Al-Mohsin, H. A.; Lee, B.; Spontak, R. J.

Local and transient nanoscale strain mapping during in situ deformation

Applied Physics Letters
2016

Gammer, C.; Kacher, J.; Czarnik, C.; Warren, O. L.; Ciston, J.; Minor, A. M.

Non-spectroscopic composition measurements of SrTiO3-La0.7Sr0.3MnO3 multilayers using scanning convergent beam electron diffraction

Applied Physics Letters
2017

Ophus, C.; Ercius, P.; Huijben, M.; Ciston, J.

Direct evidence of M2 phase during the monoclinic-tetragonal (rutile) phase transition of W-doped VO2 nanowires

Applied Physics Letters
2017

Asayesh-Ardakani, H.; Yao, W.; Nie, A.; Marley, P. M.; Braham, E.; Klie, R. F.; Banerjee, S.; Shahbazian-Yassar, R.

Multi- and few-layer graphene on insulating substrate via Pulsed laser deposition technique

Applied Surface Science
2014

Kumar, I.; Khare, A.

Attapulgite-CeO2/MoS2 ternary nanocomposite for photocatalytic oxidative desulfurization

Applied Surface Science
2019

Li, X.; Zhang, Z.; Yao, C.; Lu, X.; Zhao, X.; Ni, C.

Residual stress and crack initiation in laser clad composite layer with Co-based alloy and WC+NiCr

Applied Surface Science
2015

Lee, C.; Park, H.; Yoo, J.; Lee, C.; Woo, W.C.; Park, S.

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