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1 - 10 of 421 publications
CSV

Multi-convergence-angle ptychography with simultaneous strong contrast and high resolution

arXiv
2024

Mao, W.; Zhang, W.; Huang, C.; Zhou, L.; Kim, J. S.; Gao, S.; Lei, Y.; Wu, X.; Hu, Y.; Pei, X.; Fang, W.; Liu, X.; Song, J.; Fan, C.; Nie, Y.; Kirkland, A. I.; Wang, P.

High-resolution single particle imaging at 100-200 keV with the Gatan Alpine direct electron detector

bioRxiv
2024

Chan, L. M.; Courteau, B. J.; Maker, A.; Wu, M.; Basanta, B.; Mehmood, H.; Bulkley, D.; Joyce, D.; Lee, B. C.; Mick, S.; Gulati, S.; Lander, G. C.; Verba, K. A.

Direct observation of single-atom defects in monolayer two-dimensional materials by using electron ptychography at 200 kV acceleration voltage

Scientific Reports
2024

Chen, Y.; Chou, T. -C.; Fang, C. -H.; Lu, C. -Y.; Hsiao, C. -N.; Hsu, W. -T.; Chen, C. -C.

Probing oxidation-driven amorphized surfaces in a Ta(110) film for superconducting qubit

ACS Nano
2023

Mun, J.; Sushko, P. V.; Brass, E.; Zhou, C.; Kisslinger, K.; Qu, X.; Liu, M.; Zhu, Y.

Hopfion rings in a cubic chiral magnet

Nature
2023

Zheng, F.; Kiselev, N. S.; Rybakov, F. N.; Yang, L.; Shi, W.; Blügel, S.; Dunin-Borkowski, R. E.

Probing individual single atom electrocatalyst sites by advanced analytical scanning transmission electron microscopy

Electrochimica Acta
2023

Zachman, M. J.; Serov. A.; Lyu, X.; McKinney, S.; Yu, H.; Oxley, M. P.; Spillane, L.; Holby, E. F.; Cullen, D. A.

Reassessing chain tilt in the lamellar crystals of polyethylene

2023

Kanomi, S.; Marubayashi, H.; Miyata, T.; Jinnai, H.

Reassessing chain tilt in the lamellar crystals of polyethylene

Nature Communications
2023

Kanomi, S.; Marubayashi, H.; Miyata, T.; Jinnai, H.

STEM SerialED: Achieving high-resolution data for ab initio structure determination of beam-sensitive nanocrystalline materials

ChemRxiv
2023

Hogan-Lamarre, P.; Luo, Y.; Bücker, R.; Miller, R. J. D.; Zou, X.

Electron-counting MicroED data with the K2 and K3 direct electron detectors

Journal of Structural Biology
2022

Clabbers, M. T. B.; Martynawycz, M. W.; Hattne, J.; Nannenga, B. L.; Gonen, T.

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