出版物

881 - 890 of 910 publications

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Low-dose (S)TEM elemental analysis of water and oxygen uptake in beam sensitive materials

Ultramicroscopy
2019

Leijten, Z. J. W. A.; Wirix, J. M.; Strauss, M.; Plitzko, J. M.; de With, G.; Friedrich, H.

Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy
2010

Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

Optimising electronholography in the presence of partial coherence and instrument instabilities

Ultramicroscopy
2015

Chang, S. L.; Dwyer, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Seeing the atoms more clearly: STEM imaging from the Crewe era to today

Ultramicroscopy
2012

Pennycook, S. J.

Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Ultramicroscopy
2017

Sinclair, R.; Lee, S. C.; Shi, Y.; Chueh, W. C.

Assessing and ameliorating the influence of the electron beam on carbon nanotube oxidation in environmental transmission electron microscopy

Ultramicroscopy
2017

Koh, A. L.; Sinclair, R.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

Diffraction contrast imaging using virtual apertures

Ultramicroscopy
2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

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