出版物

881 - 890 of 910 publications

Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Ultramicroscopy
2020

Addiego, C.; Gao, W.; Pan, X.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mortensen, P. M.; Hansen, T. W.; Wagner, J. B.; Jensen, A. D.

Experimental evaluation of the ′transport-of-intensity′ equation for magnetic phase reconstruction in Lorentz transmission electron microscopy

Ultramicroscopy
2015

Kohn, A.; Habibi, A.; Mayo, M.

Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells

Ultramicroscopy
2013

Häussler, D.; Houben, L.; Essig, S.; Kurttepeli, M.; Dimroth, F.; Dunin-Borkowski, R. E.

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

Performance of a direct detection camera for off-axis electron holography

Ultramicroscopy
2016

Chang, S. L. Y.; Dwyer, C.; Barthel, J.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Low-dose (S)TEM elemental analysis of water and oxygen uptake in beam sensitive materials

Ultramicroscopy
2019

Leijten, Z. J. W. A.; Wirix, J. M.; Strauss, M.; Plitzko, J. M.; de With, G.; Friedrich, H.

Modeling of temperature profiles in an environmental transmission electron microscope using computational fluid dynamics

Ultramicroscopy
2014

Mølgaard, M. P.; Hansen, T. W.; Birkedal, W. J.; Degn, J. A.

On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

Ultramicroscopy
2015

Tang, Y. L.; Zhu, Y. L.; Ma, X. L.

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