出版物

881 - 890 of 910 publications

Practical aspects of diffractive imaging using an atomic-scale coherent electron probe

Ultramicroscopy
2016

Chen, Z.; Weyland, M.; Ercius, P.; Ciston, J.; Zheng, C.; Fuhrer, M. S.; D'Alfonso. A. J.; Allen, L. J.; Findlay, S. D.

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy
2011

Dieterle, L.;Butz, B.; Müller, E.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

Automated CBED processing: Sample thickness estimation based on analysis of zone-axis CBED pattern

Ultramicroscopy
2014

Klinger, M.; Němec, M.; Polívka, L.; Gärtnerová, V.; Jäger, A.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Experimental method for determining Cliff–Lorimer factors in transmission electron microscopy (TEM) utilizing stepped wedge-shaped specimens prepared by focused ion beam (FIB) thinning

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy

Ultramicroscopy
2014

Forbes, B. D.; Houben, L.; Mayer, J.; Dunin-Borkowski, R. E.; Allen, L. J.

Optimising electronholography in the presence of partial coherence and instrument instabilities

Ultramicroscopy
2015

Chang, S. L.; Dwyer, C.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

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