出版物

21 - 30 of 1218 publications
CSV

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

On the benefit of aberration-corrected HAADF-STEM for strain determination and its application to tailoring ferroelectric domain patterns

Ultramicroscopy
2015

Tang, Y. L.; Zhu, Y. L.; Ma, X. L.

Seeing the atoms more clearly: STEM imaging from the Crewe era to today

Ultramicroscopy
2012

Pennycook, S. J.

Elemental mapping in achromatic atomic-resolution energy-filtered transmission electron microscopy

Ultramicroscopy
2014

Forbes, B. D.; Houben, L.; Mayer, J.; Dunin-Borkowski, R. E.; Allen, L. J.

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy
2011

de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.

Electron beam-induced current imaging with two-angstrom resolution

Ultramicroscopy
2019

Mecklenburg, M.; Hubbard, W. A.; Lodico, J. J.; Regan, B. C.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Assessment of the strain depth sensitivity of Moiré sampling scanning transmission electron microscopy geometrical phase analysis through a comparison with dark-field electron holography

Ultramicroscopy
2021

Pofelski, A.; Whabi, V.; Ghanad-Tavakoli, S.; Botton, G.

Low voltage EELS - How low?

Ultramicroscopy
2014

Stöger-Pollach, M.

Structure and chemistry of epitaxial ceria thin films on yttria-stabilized zirconia substrates, studied by high resolution electron microscopy

Ultramicroscopy
2017

Sinclair, R.; Lee, S. C.; Shi, Y.; Chueh, W. C.

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