Transmission electron microscopy (TEM) resolves details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scales. Analytical TEM combines this high spatial resolution probe with the analytical capabilities of electron spectrometers, energy filters, and X-ray fluorescence systems to yield valuable compositional information about specimen structures imaged at the nanoscale.

Gatan has been developing and refining electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for almost a quarter century. Gatan EELS and EFTEM hardware and software products have consistently defined the commercial state of the art in this field. Signals captured and analyzed with Gatan systems for analytical TEM yield a wealth of information about material samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and even element-specific radial distribution of atoms.

In addition to its EELS and EFTEM product lines, Gatan also offers a variety of products to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, and spectral imaging and analysis software.

Dedicated EELS Spectrometer
Model 776 Enfina 1000

Post-Column TEM Energy Filters
Model 860 GIF 2001 Model 850 GIF 2002 Model 863 GIF Tridiem Model 865 GIF Tridiem ER

Digital STEM Imaging
Model 806 HAADF STEM Detector Model 805 BF/DF STEM Detector Model 788 DigiScan II

STEM Spectrum Imaging
Model 777 STEMPack