Serial Block-Face Imaging
3View System 3View System

Automate sectioning and image capture of your 3D ultrastructure using serial block-face scanning electron microscopy.

SEM Specimen Preparation
PECS II System PECS II System

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.

Ilion II System Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing.

Cathodoluminescence
MonoCL4 MonoCL4 System

World-leading cathodoluminescence imaging and spectroscopy system compatible with conventional, low vacuum or field emission SEM, combined FIB/SEM, and ion microscopes. 

ChromaCL2 ChromaCL2 System

Live color cathodoluminescence imaging for your scanning electron microscope.

MiniCL System MiniCL System

Cathodoluminescence imaging compatible with all scanning electron microscopes or microprobes.

SEM Specimen Stages
Murano heating stage Murano and Microtest In-Situ Stages

A range of heating and tensile stages specifically designed to enable your in-situ research. 

Cooling Stages Cooling Stages

Helium and liquid nitrogen stages to monitor cryogenic or temperature dependent studies to better understand your electrical and electronic materials. 

SEM Detectors & Control
DigiScan II System DigiScan II System

Digital beam control and image processing to enhance the photographic quality of your digital images.

SmartEBIC Photovoltaics Image SmartEBIC System

Characterize the electrical properties of your semiconductor materials and devices.

OnPoint Detector OnPoint BSE Detector

A backscattered electron detector for high speed low kV imaging in the SEM.

SEM Analysis
3D Visualization Software 3D Visualization Software

Explore your 3D data with volume rendering, isosurfaces, ortho slices and more.