News

December 11, 2014
If you are interested in advancing your EELS and EFTEM skills, we invite you to register for the April 2015 EELS & EFTEM Analysis Training School, April 14-17, 2015,  Gatan R&D Headquarters, Pleasanton, CA USA. This course reviews the basic theory and practice of EELS imaging and analysis...
November 03, 2014
Graz reconstructs spectral voxels from simultaneous EELS and EDS spectrum image tomography Transmission electron microscopy (TEM) has long been limited to supplying only projections of three-dimensional objects limiting the information that can be obtained to two dimensions.  Tilt series...
October 29, 2014
Thank you for joining us for the Optimizing STEM Spectrum Image Acquisition for High-Speed Analysis webinar (8:00 am and 4:00 pm, PDT USA, October 27, 2014). We hope you found it informative. A recording of the video is now available. RecordingWe will be continuing this webinar series on EELS and...
September 03, 2014
K2 IS high speed direct detection camera aids scientists to obtain first direct observation of facet development in nanocube growth. For nearly 150 years Gibbs theory has been used extensively in predicting the equilibrium shape during crystal growth. However, recent research on platinum (Pt)...
August 04, 2014
Gatan, Inc., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, announced the launch of the OneView™ camera for transmission electron microscopy. Using a proprietary 16 megapixel CMOS sensor optimized for both sensitivity and speed, the...
July 07, 2014
Guidelines Welcome to Gatan Research Spotlight! Research Spotlight provides electron microscopists like you the opportunity highlight your laboratory’s work, recognize team members, encourage collaboration, plus share memorable images created on your electron microscope. This information will be...
June 24, 2014
Access webinar recording here. The complementary nature of electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS) signals makes it highly desirable to acquire both during transmission electron microscope (TEM) investigations of materials. With ongoing improvements in...
June 19, 2014
Argon Ion Polishing of Focused Ion Beam Specimens in PIPS II SystemAnahita Pakzad, Gatan, Inc. As researchers push boundaries of elemental analysis and HR imaging with their transmission electron microscope (TEM), ultra-low damage specimens less than 40 nm thickness are frequently required. When...
March 19, 2014
With the advance of EBSD systems and heating stages inside the SEM, phenomena such as phase transformations and recrystallization may now be observed in real-time with high spatial resolution. These processes can then be linked to the underlying microstructure, yielding a detailed insight into how...
January 28, 2014
  In a recent study, Gatan Analytical TEM investigators demonstrated the ability to acquire atomic resolution EELS elemental maps with exceptional information densities.  These atomic level EELS elemental maps were acquired using the 200 kV analytical TEM system installed at IBM Almaden in San...

Pages