SEM Specimen Preparation
PECS II System PECS II System

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques.

Ilion II System Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing.

Solarus II Plasma Cleaner Solarus II Plasma Cleaner

The next-generation plasma tool to remove hydrocarbon contamination from TEM and SEM samples and holders.