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CSV

Gentle STEM: ADF imaging and EELS at low primary energies

Ultramicroscopy
2010

Krivanek, O. L.; Dellby, N.; Murfitt, M. F.; Chisholm, M. F.; Pennycook, T. J.; Suenaga, K.; Nicolosi, V.

Novel lift-off technique for transmission electron microscopy imaging of block copolymer films

Ultramicroscopy
2014

Roache, F. J. M.; Radjainia, M.; Williams, D. E.; Gerrard, J. A.; Travas-Sejdic, J.; Malmstrӧm, J.

In situ analysis of gas composition by electron energy-loss spectroscopy for environmental transmission electron microscopy

Ultramicroscopy
2011

Crozier, P. A.; Chenna, S.

Experimental evaluation of the ′transport-of-intensity′ equation for magnetic phase reconstruction in Lorentz transmission electron microscopy

Ultramicroscopy
2015

Kohn, A.; Habibi, A.; Mayo, M.

Seeing the atoms more clearly: STEM imaging from the Crewe era to today

Ultramicroscopy
2012

Pennycook, S. J.

CTER-rapid estimation of CTF parameters with error assessment

Ultramicroscopy
2014

Penczek, P. A.; Fang, J.; Li, X.; Cheng, Y.; Loerke, J.; Spahn, C. M. T.

Development of a focused ion beam (FIB) technique to minimize X-ray fluorescence during energy dispersive X-ray spectroscopy (EDS) of FIB specimens in the transmission electron microscope (TEM)

Ultramicroscopy
1999

Longo, D. M.; Howe, J. M.; Johnson, W. C.

Performance of a direct detection camera for off-axis electron holography

Ultramicroscopy
2016

Chang, S. L. Y.; Dwyer, C.; Barthel, J.; Boothroyd, C. B.; Dunin-Borkowski, R. E.

Mapping titanium and tin oxide phases using EELS: An application of independent component analysis

Ultramicroscopy
2011

de la Peña, F.; Berger, M. H.; Hochepied, J. F.; Dynys, F.; Stephan, O.; Walls, M.

3D imaging by serial block face scanning electron microscopy for materials science using ultramicrotomy

Ultramicroscopy
2016

Hashimoto, T.; Thompson, G. E.; Zhou, X.; Withers, P. J.

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