再現性良く試料を作製し、ソフトマテリアルにおける構造変化を測定できます。この構造変化によって遷移金属内に応力やひずみを生じ、電子伝導率に影響を与え、製品のエネルギー出力量を低下させる不可逆的な相変化を引き起こします。
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更なる微細化と新たな三次元構造の製品化への道筋をつけ、デバイス性能の向上を実現するために、材料の複雑さと欠陥をより深く理解することができます。
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Han, L.; Addiego, C.; Prokhorenko, S.; Wang, M.; Fu, H.; Nahas, Y.; Yan, X.; Cai, S.; Wei, T.; Fang, Y.; Liu, H.; Ji, D.; Guo, W.; Gu, Z.; Yang, Y.; Wang, P.; Bellaiche, L.; Chen, Y.; Wu, D.; Nie, Y.; Pan, X.
Kim, S. C.; Huang, W.; Zhang, Z.; Wang, J.; Kim, Y.; Jeong, Y. K.; Oyakhire, S. T.; Yang, Y.; Cui, Y.
Kim, M. S.; Zhang, Z.; Rudnicki, P. E.; Yu, Z.; Wang, J.; Wang, H.; Oyakhire, S. T.; Chen, Y.; Kim, S. C.; Zhang, W.; Boyle, D. T.; Kong, X.; Xu, R.; Huang, Z.; Huang, W.; Bent, S. F.; Wang, L. -W.; Qin, J.; Bao, Z.; Cui , Y.
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Gatan Microscopy Suiteとしても知られるDigitalMicrographソフトウェア。デジタルカメラの制御と共に、電子線トモグラフィ、その場観察、スペクトラムイメージング、ディフラクションイメージング、その他多くのアプリケーションをサポート。
Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties
The EELS and EFTEM systems ideal for multiuser facilities, now with the Stela hybrid-pixel option.
Enabling optically-coupled transmission electron microscopy to reveal nanoscale structural, optical, and electronic properties
EDAX Octane Elite SDDの革新的な進歩が検出器テクノロジーを次のレベルに進めます。この検出器のシリーズは、軽元素検出のための低エネルギー感度と低電圧マイクロアナリシスを目覚しく向上させる、新しいシリコンナイトライド (Si3N4) 製ウィンドウを採用しています。
An enhanced energy dispersive spectroscopy (EDS) platform with the latest silicon drift detector (SDD) technology and high-speed electronics advancements.
Delivers powerful energy dispersive spectroscopy (EDS) analytical capability in a compact package, maximizing performance and flexibility while providing streamlined operation to guarantee fast results and ease of use.
Offers high-speed electron backscatter diffraction (EBSD) mapping with the best indexing performance on real-world materials.
The world’s first and only commercially available electron backscatter diffraction (EBSD) detector with unparalleled performance as low as 3 kV.
Combines the EDAX wavelength dispersive spectrometry (WDS) analysis software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.
Combines the latest advances in energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectrometry (WDS) in a single analytical tool.
A world-class materials characterization solution that provides users with elemental composition and crystallographic orientation results in one easy-to-use package.
By integrating energy dispersive spectroscopy (EDS) and wavelength dispersive spectrometry (WDS) analytical techniques on a single platform, EDAX Neptune provides the power and flexibility of EDS with the resolution, precision, and detection limits of WDS.
Premier software program for collecting and analyzing energy dispersive spectroscopy (EDS) data and the compositional characterization of materials.
Enables the characterization of electron backscatter diffraction (EBSD) patterns within the user-friendly APEX software platform.
The premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data.
The first and only system that quantitatively reveals the distribution of lithium in scanning electron microscopes