Transmission electron microscopy (TEM) resolves details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scales. Analytical TEM combines this high spatial resolution probe with the analytical capabilities of electron spectrometers, energy filters, and X-ray fluorescence systems to yield valuable compositional and structural information about specimens.

Gatan has been developing and refining electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for almost a quarter century. Gatan EELS and EFTEM hardware and software products have consistently defined the commercial state of the art in this field. Signals captured and analyzed with Gatan systems for analytical TEM yield a wealth of information about material samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and even element-specific radial distribution of atoms.

In addition to its EELS and EFTEM product lines, Gatan also offers a variety of products to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, and spectral imaging and analysis software.