Transmission electron microscopy (TEM) resolves details of natural and man-made structures at the micrometer, nanometer, and even sub-nanometer scales. Analytical TEM combines this high spatial resolution imaging with the analytical capabilities of electron enery loss spectrometers, energy filters, and energy dispersive X-ray spectroscopy systems. Gatan leads in Analytical TEM, enabling studies of compostion, chemistry and many materials properties, via the techniques of electron energy loss spectroscopy (EELS) and enegry filtered TEM (EFTEM).
 
Gatan has been developing and refining electron energy loss spectroscopy (EELS) and energy-filtered TEM (EFTEM) systems for almost a quarter century. Gatan EELS and EFTEM hardware and software products have consistently defined the commercial state of the art in this field. Signals captured and analyzed with Gatan systems for analytical TEM yield a wealth of information about samples probed by a transmitted electron beam, including sample thickness, elemental and chemical composition, electronic structure and energy levels, frequency-dependent dielectric response, and even element-specific radial distribution of atoms.

In addition to its EELS and EFTEM product lines, Gatan also offers a variety of products to enhance and support scanning-mode TEM (STEM) analysis, including digital beam scan and imaging systems, STEM detectors optimized for the STEM EELS technique, EDS data acquisition and analysis software, and spectral imaging and analysis software.