SmartEBIC System

Characterize the electrical properties of your semiconductor materials and devices.

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  • Quantitatively characterize electrical properties of materials and devices including: in-situ IV tracing, identify p-n junction position and measure depletion region widths, determine minority carrier diffusion lengths and defect recombination strengths
  • Designed for low noise DC measurement allowing picoamp accuracy current measurements
  • Complete system from sample holder and specimen contacting to acquisition and analysis software
  • Simple yet powerful software for experiment control and data analysis including auto set up routines


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