GIF Quantum Energy Filters

High throughput spectrometers to capture highly detailed data from your EELS and EFTEM experiments.

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The GIF Quantum® filter represents the fourth and most advanced generation of post-column energy filters by Gatan. Redesigned from the ground up, the GIF Quantum filter combines advanced dodecapole-based electron optics with a blazing fast CCD camera system to yield an imaging filter that defines the new state-of-the-art in the capture of both highly detailed electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscope (EFTEM) data sets with maximum throughput.

  • No compromise between EFTEM and EELS performance. Patented sensor readout architecture allows the same CCD sensor to be used interchangeably as a full-frame, high quality imaging device, a high speed live viewing device, and an ultra-fast spectroscopy device
  • Aberration correction up to the fifth order allows the use of a 9 mm entrance aperture for EFTEM and 5 mm entrance aperture for energy loss spectroscopy at performance specifications superior to that of the third generation GIF Tridiem® filter
  • Acquire images and spectra with unprecedented exposure control and dynamic range using integrated electrostatic shutter
  • High speed (1000 spectra/s), dose-efficient scanning transmission electron microscope (STEM) EELS spectrum imaging for detail rich mapping
  • Large field of view energy filtered imaging, mapping, and diffraction with narrow slit widths using 9 mm entrance aperture
  • Improved collection efficiency for aberration corrected STEM EELS using 2.5 and 5 mm entrance aperatures
  • Low noise imaging and high speed viewing from the same detector during dual-speed camera readout mode
  • Broad range of operating modes and configurations from 60 – 300 kV
  • Capture a broader range of edges (2000 eV range) in a single spectrum for simplified quantification
  • Effortlessly measure precise energy shifts and apply advanced quantification routines for a new level of EELS analysis using DualEELS™ capability
  • Increased confidence that imaging filter is operating at peak performance with advanced autotuning
  • Outstanding energy resolution and very low image distortions using dodecapole-based optics

GIF Quantum SE system—Ideal for efficient filtered imaging and mapping while providing basic EELS support, and for tomography and beam sensitive samples when outfitted with a low dose scintillator. System comes standard with a 5 mm entrance aperture and the base performance of the Gatan US1000XP/FT camera system.

GIF Quantum ER system—System of choice for STEM EELS acquisition and fast EFTEM mapping from a broad range of electron sources. System comes standard with a 9 mm imaging aperture, STEM detector, electrostatic shutter, and the advanced modes of the US1000XP/FT camera system.

GIF Quantum ERS system—Highest energy resolution system available. Suitable only for monochromated electron sources. System comes with the same options as the GIF Quantum ER filter but also includes specialized electronics and components allowing it to break the 100 meV barrier.

For more information pertaining to EELS techniques, step-by-step instructions on analytical experiments, and access to downloadable spectra, please visit, an educational site that is dedicated to supporting the EELS community.


Physical Review Letters

Lin,Y. -C.; Teng, P. -Y.; Chiu, P, -W.; Suenaga, K.


Mecklenburg, M.; Hubbard, W. H.; White, E. R.; Dhall, R.; Cronin, S. B.; Aloni, S.; Regan, B. C.


Mørtsell, E. A.; Wenner, S.; Longo, P.; Andersen, S. J.; Marioara, C. D.; Holmestad, R.



Models 963, 965, 966


GIF Quantum overview
GIF Quantum ER system
GIF Quantum ERS system
GIF Quantum SE system


Atomic level EELS mapping using high energy edges in DualEELS™ mode
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
EELS: A tool for investigating biological materials
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum® system
Fast STEM spectrum imaging using simultaneous EELS and EDS in Gatan Microscopy Suite® software
Review of recent advances in spectrum imaging and its extension to reciprocal space
The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level


Fast STEM EELS spectrum imaging analysis of Pd-Au based catalysts
The high efficiency of the latest generation EELS spectrometers allow highly detailed EELS spectra from heavy elements to be acquired in a matter of milliseconds resulting in composition maps with outstanding information content.

A quantitative investigation of biological materials using EELS
EELS has proved to be a valuable tool to obtain compositional information from biological samples. In addition to the composition, EELS also gives insight into the chemistry unveiling the nature of the chemical bonds and different oxidation states.

High-speed composition analysis of high-z metal alloys in DualEELS mode
Demonstrating that high-speed atomic EELS composition maps with high contrast and high signal-to-noise ratio can be acquired routinely from high-energy edges.

Fast atomic level EELS mapping analysis using high-energy edges in DualEELS mode
Demonstrating that atomic EELS mapping using high-energy edges is very effective. The high signal-to-background ratio of high-energy edges leads to simplified data extraction.

Atomic resolved EELS analysis across interfaces in III-V MOSFET high-k dielectric gate stacks
Demonstrating that EELS SI can reveal the elemental distribution at the gate of high-k MOSFET devices at atomic column level.


Specification (200 kV) GIF Quantum SE GIF Quantum ER GIF Quantum ERS
Energy resolution* (eV FWHM) 0.25 0.10 0.04
Isochromaticity (eV P-P ) 2.0 2.0 2.0
Distortion (% max) 1.50 0.75 0.75
Chromatic dist (% per 50 eV) 0.45 0.20 0.20
Aperture size (mm) 2.5 / 5 2.5 / 5 / 9 2.5 / 5 / 9
Energy field of view (eV) 2000 2000 2000
Spectral rate (1/s) 100 >1000 >1000
Fast camera modes Optional
1 µs electrostatic shutter Optional
Advanced BF/DF detector Optional
*Filter contribution of the total system energy resolution. Does not include electron source or environmental contributions. The final system resolution is typically a quadrature sum of all contributions. For example, taking a sFEG TEM system with a 0.8 eV source and no environmental noise, the expectation would be a system resolution of (0.8*0.8 + 0.25*0.25)0.5 = 0.84 eV.

Related products

Advanced AutoFilter® suite software
Advanced BF/DF detector
DualEELS mode
Advanced STEM detectors    
High speed camera and shutter
High speed 2 kV spectrum offset module
STEMPack™ with advanced BF/DF detector
STEMPack high speed spectrum imaging upgrade
STEMPack high speed EDS acquisition upgrade

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