Spectroscopic mapping by STEM-EELS is a powerful technique for determining the structure and chemistry of a wide range of biological, natural, and engineered materials and interfaces down to atomic resolution. The continual push for more robust, sensitive, and localized characterization is enabled by significant and ongoing improvements to hardware throughout the STEM-EELS instrument.
得益于近来冷冻透射电镜在材料科学领域的发展,我们现在能够在TEM中对Li基电池材料进行成像,并避免副反应和电子束损伤的发生,对SEI的化学组成和纳米结构实现可视化呈现并能够与电池性能表现直接关联起来,为电池的电化学反应和老化现象提供了全新视角。在本次报告中,William Huang 着重介绍了他运用冷冻电镜对下一代硅和金属锂阳极中的 SEI 特性与失效模型进行研究的工作情况。