Imaging fast reactions and nanoscale growth webinar
Presentation courtesy of Eric Stach, Brookhaven National Laboratory
During this webinar Dr. Stach will describe the impact of K2 IS direct electron detectors for the field of materials science. In particular, the ability to image reactions of nanoscale volumes directly in the electron microscope at high speeds will increase our knowledge of the science of materials growth, impacting fields such as catalysis and materials discovery and design. The webinar will also address the issues surrounding large data handling for these experiments.
Catch the upcoming Metro webinar!
This webinar shows how electron counting suppresses background noise, expanding dynamic range, and producing high-fidelity patterns, even on highly beam‑sensitive materials.
Real-time in-situ insights: Dynamic mapping with 4D STEM
In this webinar, we explore the new survey mapping tool in DigitalMicrograph 3.6.2, enabling real-time processing of 4D STEM data for dynamic in-situ experiments. Learn how to generate live maps, reduce data volumes, and make faster, informed decisions at the microscope. We also demonstrate the enhanced flexibility enabled by using DM Scripts for processing. This can streamline unique or complex analyses and capture critical sample dynamics without overwhelming storage resources.
4D STEM orientation mapping in DigitalMicrograph with STEMx OIM
STEMx OIM is the latest addition to 4D STEM analysis tools in DigitalMicrograph software, which automates 4D STEM orientation and phase mapping, with no scripting required!
This webinar covers STEMx OIM workflows for diffraction indexing and orientation mapping, and demonstrates how to leverage eaSI technology for advanced experiments, including precession electron diffraction and multimodal 4D STEM combined with EELS or EDS.
Advances in scintillator camera technology for modern TEM webinar
Gatan scintillator cameras are a true workhorse camera platform, as they are used across the field of TEM applications from diffraction imaging to high-speed in-situ experiments. These cameras have evolved significantly over time to meet the growing experimental requirements of new microscopy techniques.
When less is more – Reducing dose, damage, and duration with counted EELS
Acquiring high fidelity electron energy loss spectroscopy (EELS) spectra is a long-standing challenge. The combined need for a large energy range (keV), sharp energy resolution, and simultaneous high dynamic range (orders of magnitude) is a major challenge. Traditionally, EELS is recorded on a single parallel sensor. However, conventional detectors have limited dynamic range and very limited energy range at energy high resolution. These can be improved by taking two spectra in rapid succession, but at the cost of wasted dose applied to the sample (and time for acquisition).
Dose-fractionated EELS spectrum image acquisition with direct detection cameras
Multi-frame spectrum image (SI) summation has been proposed and successfully demonstrated as a means of improving both scanning transmission electron microscopy (STEM) spectrum image resolution and signal-to-noise ratio (SNR) [1]. Scintillator-based CMOS and CCD detectors are inadequate for multi-frame electron energy loss spectroscopy (EELS) SI at low-dose and high speeds due to the detrimental effects of read noise.
Extremely dose efficient EELS spectrum image acquisition with Gatan eaSI technology
GIF Continuum K3 IS: Advanced direct detection for in-situ chemical analysis
Gatan DigitalMicrograph is a well-established software tool for performing in-situ (S)TEM experiments. This powerful capability has now been expanded to allow capture and analysis of in-situ EELS and spectrum imaging datasets. This video demonstrates the unique in-situ data acquisition and analysis capability of this advanced software platform when operated together with the GIF Continuum® K3® system.
Continuously acquired 4D STEM and EELS spectrum images for in-situ microscopy webinar
In this webinar, we presented new tools for in-situ EELS spectrum imaging and in-situ 4D STEM. In addition to a simple interface for continuous acquisition with live drift correction, Gatan has developed a suite of tools for processing and visualizing these multi-dimensional datasets. While faster detectors make a continuous acquisition of analytical data feasible, these tools for the management of the resulting data make such experiments practical.
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