Microscopy & Microanalysis 2023
Booth #504

Gatan and EDAX are now combined to develop new approaches that uncover insights and explore the boundaries of your transmission and scanning electron microscopy (TEM and SEM) research. Under the Gatan name, customers will receive reliable, cutting-edge products of the highest quality while maintaining the responsive customer care that you expect. Now together, let’s discover how to achieve your next breakthrough.

DEMONSTRATIONS in Gatan/EDAX Booth #504

Reserve time with the Gatan and EDAX teams to experience how our state-of-the-art solutions can address your most challenging applications. Sessions are hosted in the booth (#504) and will connect you with an industry specialist who will demonstrate hardware via a live-remote microscope session.

Request a Demo

 

EDAX Clarity EBSD System Cipher System
GIF Continuum K3 with Stela System* Alpine Direct Detection Camera
 
Additional demonstrations
  • EDAX EDS Powered by Gatan
  • Stela Hybrid-Pixel Camera
  • STEMx 4D STEM Diffraction
  • EDAX Velocity EBSD System
  • EDAX Octane Elite EDS System

*Utilizes DECTRIS hybrid-pixel technology
  • EDAX Pegasus EBSD-EDS Systems
  • EDAX OIM Analysis
  • EDAX APEX Software
  • DigitalMicrograph Software

DEMONSTRATIONS in JEOL Booth #706

Reserve time with the Gatan and JEOL teams to see the power of the JEOL 1400 Flash TEM and Gatan Metro Counting Camera.


Metro Counting Camera
Request a Demo
 

LUNCH & LEARNS

Join us in Gatan/EDAX booth #504 to learn about the new products and applications that can help you achieve your next breakthrough. 

Monday, July 24

12:30 – 1:00 p.m.

Recharge your lithium research—Workflow and tools for the characterization of materials used in the construction of lithium-ion batteries
David Stowe

1:00 – 1:30 p.m.

Improving EBSD data quality using spherical indexing
Stuart Wright

Tuesday, July 25

12:15 – 1:15 p.m.

Everyday direct detection with the Metro counting camera (JEOL Booth #706)
Ben Miller

12:30 – 1:00 p.m.

ClearView and Metro, new Gatan cameras for advanced TEM
Cory Czarnik

1:00 – 1:30 p.m.

Maximizing throughput and data quality with the BioContinuum HD
Stephen Mick

Wednesday, July 26

12:30 – 1:00 p.m.

eaSI: Exclusive technology for advanced STEM experiments with the highest efficiency
Ana Pakzad

1:00 – 1:30 p.m.

Elevate your EELS: Propelling materials research forward with innovative EELS solutions!
Ray Twesten and Liam Spillane

VENDOR TUTORIALS

Gain in-depth knowledge about techniques and analyses that can help advance your research. All presentations are in the Gatan and EDAX booth (#504) from 5:45 – 6:45 p.m. each day. Attendees must pre-register at booth #504. Space is limited. 

Monday, July 24

Equipment ecosystem for low dose and cryo-EM
Stephen Mick and Sahil Gulati
 

DigitalMicrograph: A multifaceted platform for advanced STEM studies
Ana Pakzad

Tuesday, July 25

How to use spherical indexing in OIM Analysis for better data quality
Stuart Wright
 

Multimodal in-situ spectroscopy
Liam Spillane

Wednesday, July 26

From electrons to images: A crash course in EM camera technology
Cory Czarnik

POSTERS/PRESENTATIONS

Monday, July 24

3:00 – 5:00 p.m.

Mechanisitic determination of metal-organic framework degradation under humid conditions through ex-situ STEM
Michael L. Barsoum, Northwestern University (P10.P1, Poster 82)

Tuesday, July 25

11:00 – 11:15 a.m.

Continuous 4D STEM recording and visualization for in-situ experiments
Ben Miller (A04.3)

2:15 – 2:30 p.m.

Accurate elemental mapping of semiconductor devices using EDS – Deconvolving overlapping peaks
Shangshang Mu (A02.4)

2:45 – 3:00 p.m.

Revealing local ordering in PbSr2S3 thin films and its effect on optical properties utilizing 4D STEM and EELS techniques
Patricia E. Meza, Northwestern University (P10.4)

3:00 – 5:00 p.m.

Elucidating the role of nanoscale organics in natural nanocomposite materials
Dr. Paul Smeets, Northwestern University (P10.P2, Poster 188)

3:00 – 5:00 p.m.

Effects of membrane thickness, gas pressure and electron dose in gas cell transmission electron microscopy
Dr. Xiaobing Hu, Northwestern University (P07.P1, Poster 174)

Wednesday, July 26

11:45 a.m. – 12:00 p.m.

Probing the “order” in complexity: Entropy-engineered thermoelectric materials
Yukun Liu, Northwestern University (P01.2)

2:00 – 2:15 p.m.

Phase diversity in ptychographic reconstructions with a programmable phase plate
Stephanie Ribet, Lawrence Berkeley National Lab (A04.6)

2:45 – 3:00 p.m.

Continuous multiple pass electron counted spectrum imaging optimized for in-situ analysis
Liam Spillane (A05.2)

3:00 – 5:00 p.m.

An IR filter for in-situ STEM-EDS heating and multimodal STEM experiments in DigitalMicrograph
Ana Pakzad (P10.P3, Poster 319)

3:00 – 5:00 p.m.

Assessing critical dose for beam-sensitive samples using low-dose counted in-situ video
Ben Miller (P10.P3, Poster 320)

3:00 – 5:00 p.m.

Dose-fractionated EELS through multipass in-situ spectrum imaging
Andrew Thron (P10.P3, Poster 324)

Thursday, July 27

9:30 – 9:45 a.m.

Revealing the 2D distribution of lithium in cathode materials using the composition-by-difference method
Jonathan Lee (C03.6)

9:45 – 10:00 a.m.

Trace element identification and quantification in solar cell materials using energy dispersive and cathodoluminescence spectroscopy
Jonathan Lee (C03.6)

10:00 – 12:00 p.m.

Machine learning enabled image classification for automated data acquisition in the electron microscope
Carolin B. Wahl, Northwestern University (C01.P1, Poster 381)

10:00 a.m. – 12:00 p.m.

Automated continuous diffraction tomography with Gatan direct detection electron counting cameras: Advantages and best practices for data acquisition
Sahil Gulati (B05.P2, Poster 347)

10:00 a.m. – 12:00 p.m.

Autonomous multimodal spectrum imaging for high throughput data acquisition
Liam Spillane (C01.P1, Poster 377)