Gatan and EDAX are now combined to develop new approaches that uncover insights and explore the boundaries of your transmission and scanning electron microscopy (TEM and SEM) research. Under the Gatan name, customers will receive reliable, cutting-edge products of the highest quality while maintaining the responsive customer care that you expect. Now together, let’s discover how to achieve your next breakthrough.
Reserve time with the Gatan and EDAX teams to experience how our state-of-the-art solutions can address your most challenging applications. Sessions are hosted in the booth (#504) and will connect you with an industry specialist who will demonstrate hardware via a live-remote microscope session.
Request a Demo |
EDAX Clarity EBSD System | Cipher System |
GIF Continuum K3 with Stela System* | Alpine Direct Detection Camera |
Additional demonstrations
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*Utilizes DECTRIS hybrid-pixel technology |
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Reserve time with the Gatan and JEOL teams to see the power of the JEOL 1400 Flash TEM and Gatan Metro Counting Camera. |
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Join us in Gatan/EDAX booth #504 to learn about the new products and applications that can help you achieve your next breakthrough.
Monday, July 24 |
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12:30 – 1:00 p.m. |
Recharge your lithium research—Workflow and tools for the characterization of materials used in the construction of lithium-ion batteries |
1:00 – 1:30 p.m. |
Improving EBSD data quality using spherical indexing |
Tuesday, July 25 |
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12:15 – 1:15 p.m. |
Everyday direct detection with the Metro counting camera (JEOL Booth #706) |
12:30 – 1:00 p.m. |
ClearView and Metro, new Gatan cameras for advanced TEM |
1:00 – 1:30 p.m. |
Maximizing throughput and data quality with the BioContinuum HD |
Wednesday, July 26 |
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12:30 – 1:00 p.m. |
eaSI: Exclusive technology for advanced STEM experiments with the highest efficiency |
1:00 – 1:30 p.m. |
Elevate your EELS: Propelling materials research forward with innovative EELS solutions! |
Gain in-depth knowledge about techniques and analyses that can help advance your research. All presentations are in the Gatan and EDAX booth (#504) from 5:45 – 6:45 p.m. each day. Attendees must pre-register at booth #504. Space is limited.
Monday, July 24 |
Equipment ecosystem for low dose and cryo-EM |
DigitalMicrograph: A multifaceted platform for advanced STEM studies |
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Tuesday, July 25 |
How to use spherical indexing in OIM Analysis for better data quality |
Multimodal in-situ spectroscopy |
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Wednesday, July 26 |
From electrons to images: A crash course in EM camera technology |
Monday, July 24 |
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3:00 – 5:00 p.m. |
Mechanisitic determination of metal-organic framework degradation under humid conditions through ex-situ STEM |
Tuesday, July 25 |
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11:00 – 11:15 a.m. |
Continuous 4D STEM recording and visualization for in-situ experiments |
2:15 – 2:30 p.m. |
Accurate elemental mapping of semiconductor devices using EDS – Deconvolving overlapping peaks |
2:45 – 3:00 p.m. |
Revealing local ordering in PbSr2S3 thin films and its effect on optical properties utilizing 4D STEM and EELS techniques |
3:00 – 5:00 p.m. |
Elucidating the role of nanoscale organics in natural nanocomposite materials |
3:00 – 5:00 p.m. |
Effects of membrane thickness, gas pressure and electron dose in gas cell transmission electron microscopy |
Wednesday, July 26 |
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11:45 a.m. – 12:00 p.m. |
Probing the “order” in complexity: Entropy-engineered thermoelectric materials |
2:00 – 2:15 p.m. |
Phase diversity in ptychographic reconstructions with a programmable phase plate |
2:45 – 3:00 p.m. |
Continuous multiple pass electron counted spectrum imaging optimized for in-situ analysis |
3:00 – 5:00 p.m. |
An IR filter for in-situ STEM-EDS heating and multimodal STEM experiments in DigitalMicrograph |
3:00 – 5:00 p.m. |
Assessing critical dose for beam-sensitive samples using low-dose counted in-situ video |
3:00 – 5:00 p.m. |
Dose-fractionated EELS through multipass in-situ spectrum imaging |
Thursday, July 27 |
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9:30 – 9:45 a.m. |
Revealing the 2D distribution of lithium in cathode materials using the composition-by-difference method |
9:45 – 10:00 a.m. |
Trace element identification and quantification in solar cell materials using energy dispersive and cathodoluminescence spectroscopy |
10:00 – 12:00 p.m. |
Machine learning enabled image classification for automated data acquisition in the electron microscope |
10:00 a.m. – 12:00 p.m. |
Automated continuous diffraction tomography with Gatan direct detection electron counting cameras: Advantages and best practices for data acquisition |
10:00 a.m. – 12:00 p.m. |
Autonomous multimodal spectrum imaging for high throughput data acquisition |