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Interface morphology and composition of Ga(NAsP) quantum well structures for monolithically integrated LASERs on silicon substrates

Journal of Physics D: Applied Physics

2016

Wegele, T.; Beyer, A.; Ludewig, P.; Rosenow, P.; Duschek, L.; Jandieri, K.; Tonner, R.; Stolz, W.; Volz, K.

Titanium induced polarity inversion in ordered (In,Ga)N/GaN nanocolumns

Nanotechnology

2016

Kong, X.; Li, H.; Albert, S.; Bengoechea-Encabo, A.; Sanchez-Garcia, M. A.; Calleja, E.; Draxl, C.; Trampert, A.

Diffraction contrast imaging using virtual apertures

Ultramicroscopy

2015

Gammer, C.; Ozdol, V. B.; Liebscher, C. H.; Minor, A. M.

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

Applied Physics Letters

2015

Ozdol, V. B.; Gammer,C.; Jin, X. G.; Ercius, P.; Ophus, C.; Ciston,J.; Minor, A. M.

Near-field plasmonic behavior of Au/Pd nanocrystals with Pd-rich tips

Plasma Physics

2015

Ringe, E.; DeSantis, C. J.; Collins, S. M.; Duchamp, M.; Dunin-Borkowski, R. E.; Skrabalak, S. E.; Midgley, P. A.

Absence of intracellular ion channels TPC1 and 2 leads to mature-onset obesity in male mice, due to impaired lipid availability for thermogenesis in brown adipose tissue

Endocrinology

2014

Lear, P. V.; González-Touceda, D.; Couto, B. P.; Viaño, P.; Guymer, V.; Remzova, E.; Tunn, R.; Chalasani, A.; García-Caballero, T.; Hargreaves, I. P.; Tynan, P. W.; Christian, H. C.; Nogueiras, R.; Parrington, J.; Diéguez, C.

Microstructure characteristics of high lift factor MOCVD REBCO coated conductors with high Zr content

IEEE Transactions on Applied Superconductivity

2014

Galstyan, E.; Gharacheshmeh, H. M.; Delgado, L.; Xu, A.; Majkic, G.; Selvamanickam, V.

In-situ study of the mechanisms of high temperature damage in elastic-plastic cyclic loading of nickel superalloy

Advanced Materials Research

2014

Petrenec, M.; Polák, J.; Šamořil, T.; Dluhoš, J.; Obrtlík, K.

Optimized Ar+-ion milling procedure for TEM cross-section sample preparation

Ultramicroscopy

2011

Dieterle, L.;Butz, B.; Müller, E.

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