Murano and Microtest In-Situ Stages

A range of heating and tensile stages specifically designed to enable your in-situ research. 

Advantages Research Spotlight Media Library Publications Resources Back to top

In-situ heating and tensile testing stages allow dynamic microstructural observations and can provide new insights into materials research.

  • Modules are specially engineered for the scanning electron microscope (SEM) environment
  • Custom designs allow quick fitting and removal from SEM stages so normal SEM use can be resumed quickly
  • Designed to be compatible with geometrical requirements of different detectors including electron backscatter diffraction (EBSD) for dynamic observations
Murano heating stage
  • Murano stage available for heating to 950 °C for EBSD applications and secondary electron detector (SED) imaging
  • Study real-time crystallization and phase transformations at elevated temperatures up to 950 °C 
  • Proprietary design enables offline specimen mounting and storage
  • Bulk specimen support designed specifically to operate within EBSD/focused ion beam (FIB)/SED geometry constraints
  • Water cooling and heat protective shielding ensure maximum protection at elevated temperatures
  • Additional bias control to assist with imaging at elevated temperatures
Microtest tensile stages
  • Allows dynamic testing experiments in the SEM
  • Provides a deeper understanding into what causes the deformation; and the ability to image where the microstructure change is occurring
  • Tensile, compression and bending tests available
  • Options for different load cells with load ranges from 2 N up to 5000 N to provide greater resolution for a wider range of specimens
  • Easy to use software interface provides live graphing of quantitative data together with flexible thresholding for more complex experiments, including cyclical loading 
  • Unique MTVideo option allows synchronized image and data acquisition providing detailed post experiment analysis of the sample deformation and corresponding captured SED images
  • Option for complete replacement X,Y,Z stage door for SEM provides greater flexibility for heavier stages
 Model # Maximum tensile
Heating option Cooling option EBSD option 3 or 4 Point bending option Changeable load cell
Mtest200 200 N  
Mtest300 300 N      
Mtest2000 2000 N      
Mtest2000E 2000 N    
Mtest5000 5000 N *
* Requires replacement XYZ stage


Journal of Materials Processing Technology

Hattingh, D. G.; von Welligh, L. G.; Bernard, D.; Susmel, L.; Tovo, R.; James, M. N.

Composites Part A: Applied Science and Manufacturing

Voznyak, Yu.; Morawiec, J.; Galeski, A.

International Journal of Fatigue

Maggiolini, E.; Tovo, R.; Susmel, L.; James, M. N.; Hattingh, D. G.

Back to top